Chieh-Yang Chen, Wen-Tsung Huang, Yiming Li. Electrical characteristic and power consumption fluctuations of trapezoidal bulk FinFET devices and circuits induced by random line edge roughness. In Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015. pages 61-64, IEEE, 2015. [doi]
Abstract is missing.