Zhimin Chen, Syed Haider, Patrick Schaumont. Side-Channel Leakage in Masked Circuits Caused by Higher-Order Circuit Effects. In Jong Hyuk Park, Hsiao-Hwa Chen, Mohammed Atiquzzaman, Changhoon Lee, Tai-Hoon Kim, Sang-Soo Yeo, editors, Advances in Information Security and Assurance, Third International Conference and Workshops, ISA 2009, Seoul, Korea, June 25-27, 2009. Proceedings. Volume 5576 of Lecture Notes in Computer Science, pages 327-336, Springer, 2009. [doi]
Abstract is missing.