Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra. Data-Driven Test Plan Augmentation for Platform Verification. IEEE Design & Test of Computers, 34(5):23-29, 2017. [doi]
@article{ChenHWB17,
title = {Data-Driven Test Plan Augmentation for Platform Verification},
author = {Wen Chen and Kuo-Kai Hsieh and Li-Chung Wang and Jayanta Bhadra},
year = {2017},
doi = {10.1109/MDAT.2017.2713390},
url = {https://doi.org/10.1109/MDAT.2017.2713390},
researchr = {https://researchr.org/publication/ChenHWB17},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {34},
number = {5},
pages = {23-29},
}