Heterogeneous Defect Prediction through Joint Metric Selection and Matching - researchr publication authors

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Haowen Chen, Xiao-Yuan Jing, Baowen Xu. Heterogeneous Defect Prediction through Joint Metric Selection and Matching. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021. pages 367-377, IEEE, 2021. [doi]

This author has not been identified. Look up 'Haowen Chen' in GoogleThis author has not been identified. Look up 'Xiao-Yuan Jing' in GoogleThis author has not been identified. Look up 'Baowen Xu' in Google

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