Haowen Chen, Xiao-Yuan Jing, Baowen Xu. Heterogeneous Defect Prediction through Joint Metric Selection and Matching. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021. pages 367-377, IEEE, 2021. [doi]
@inproceedings{ChenJX21-2,
title = {Heterogeneous Defect Prediction through Joint Metric Selection and Matching},
author = {Haowen Chen and Xiao-Yuan Jing and Baowen Xu},
year = {2021},
doi = {10.1109/QRS54544.2021.00048},
url = {https://doi.org/10.1109/QRS54544.2021.00048},
researchr = {https://researchr.org/publication/ChenJX21-2},
cites = {0},
citedby = {0},
pages = {367-377},
booktitle = {21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021},
publisher = {IEEE},
isbn = {978-1-6654-5813-9},
}