Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration

Wen-Yi Chen, Ming-Dou Ker, Yeh-Jen Huang, Yeh-Ning Jou, Geeng-Lih Lin. Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 61-64, IEEE, 2008. [doi]

Abstract

Abstract is missing.