Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, Mango Chia-Tso Chao. Statistical techniques for predicting system-level failure using stress-test data. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{ChenKTC15,
title = {Statistical techniques for predicting system-level failure using stress-test data},
author = {Harry H. Chen and Shih-Hua Kuo and Jonathan Tung and Mango Chia-Tso Chao},
year = {2015},
doi = {10.1109/VTS.2015.7116260},
url = {http://dx.doi.org/10.1109/VTS.2015.7116260},
researchr = {https://researchr.org/publication/ChenKTC15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}