Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, Mango Chia-Tso Chao. Statistical techniques for predicting system-level failure using stress-test data. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.