Enhancing Diagnosis Resolution For Delay Faults By Path Extension Method - researchr publication authors

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Ying-Yen Chen, Jing-Jia Liou. Enhancing Diagnosis Resolution For Delay Faults By Path Extension Method. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 428-438, IEEE Computer Society, 2006. [doi]

This author has not been identified. Look up 'Ying-Yen Chen' in GoogleThis author has not been identified. Look up 'Jing-Jia Liou' in Google

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