Ying-Yen Chen, Jing-Jia Liou. Enhancing Diagnosis Resolution For Delay Faults By Path Extension Method. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 428-438, IEEE Computer Society, 2006. [doi]
Abstract is missing.