Fault modeling and testing of 1T1R memristor memories

Yong-Xiao Chen, Jin-Fu Li. Fault modeling and testing of 1T1R memristor memories. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

Abstract

Abstract is missing.