The data retention improvement with 2T structure OTP on 0.18um CMOS technology

Guanyu Chen, Feng Lin, Yongliang Gao, Chunxu Li, Duowu Wen, Zhe Zhang. The data retention improvement with 2T structure OTP on 0.18um CMOS technology. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

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