Qi Chen, Cheng Li, Fei Lu 0004, Chenkun Wang, Feilong Zhang, Albert Z. Wang, Jimmy Ng, Ya-Hong Xie. TLP measurement and analysis of graphene NEMS switches for on-chip ESD protection. In 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017, Los Angeles, CA, USA, April 9-12, 2017. pages 370-374, IEEE, 2017. [doi]
Abstract is missing.