Qi Chen, Cheng Li, Fei Lu 0004, Chenkun Wang, Feilong Zhang, Tianru Wu, Xiaoming Xie, Kun Zhang, Xinxin Li, Jimmy Ng, Ya-Hong Xie, Yuhua Cheng, Albert Z. Wang. Characterization of single-crystalline graphene ESD interconnects. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 977-980, IEEE, 2017. [doi]
@inproceedings{ChenLLWZWXZLNXC17,
title = {Characterization of single-crystalline graphene ESD interconnects},
author = {Qi Chen and Cheng Li and Fei Lu 0004 and Chenkun Wang and Feilong Zhang and Tianru Wu and Xiaoming Xie and Kun Zhang and Xinxin Li and Jimmy Ng and Ya-Hong Xie and Yuhua Cheng and Albert Z. Wang},
year = {2017},
doi = {10.1109/ASICON.2017.8252641},
url = {https://doi.org/10.1109/ASICON.2017.8252641},
researchr = {https://researchr.org/publication/ChenLLWZWXZLNXC17},
cites = {0},
citedby = {0},
pages = {977-980},
booktitle = {12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017},
editor = {Yajie Qin and Zhiliang Hong and Ting-Ao Tang},
publisher = {IEEE},
isbn = {978-1-5090-6625-4},
}