Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET

Sihao Chen, Yu Li, Baokang Peng, Zixuan Sun, Lining Zhang, Runsheng Wang, Ru Huang 0001. Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 7, IEEE, 2024. [doi]

Abstract

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