Gated Decap: gate leakage control of on-chip decoupling capacitors in scaled technologies - researchr publication authors

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Yiran Chen, Hai Li, Kairshik Roy, Cheng-Kok Koh. Gated Decap: gate leakage control of on-chip decoupling capacitors in scaled technologies. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 775-778, IEEE, 2005. [doi]

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