Yiran Chen, Hai Li, Kairshik Roy, Cheng-Kok Koh. Gated Decap: gate leakage control of on-chip decoupling capacitors in scaled technologies. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 775-778, IEEE, 2005. [doi]
@inproceedings{ChenLRK05-0,
title = {Gated Decap: gate leakage control of on-chip decoupling capacitors in scaled technologies},
author = {Yiran Chen and Hai Li and Kairshik Roy and Cheng-Kok Koh},
year = {2005},
doi = {10.1109/CICC.2005.1568783},
url = {http://dx.doi.org/10.1109/CICC.2005.1568783},
researchr = {https://researchr.org/publication/ChenLRK05-0},
cites = {0},
citedby = {0},
pages = {775-778},
booktitle = {Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005},
publisher = {IEEE},
isbn = {0-7803-9023-7},
}