Ontology-Driven Learning of Bayesian Network for Causal Inference and Quality Assurance in Additive Manufacturing - researchr publication

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Ruimin Chen, Yan Lu, Paul Witherell, Timothy W. Simpson, Soundar R. T. Kumara, Hui Yang 0003. Ontology-Driven Learning of Bayesian Network for Causal Inference and Quality Assurance in Additive Manufacturing. IEEE Robotics and Automation Letters, 6(3):6032-6038, 2021. [doi]

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