An indirect current sensing technique for IDDQ and IDDT tests

Chuen-Song Chen, Jien-Chung Lo, Tian Xia. An indirect current sensing technique for IDDQ and IDDT tests. In Gang Qu, Yehea I. Ismail, Narayanan Vijaykrishnan, Hai Zhou, editors, Proceedings of the 16th ACM Great Lakes Symposium on VLSI 2006, Philadelphia, PA, USA, April 30 - May 1, 2006. pages 235-240, ACM, 2006. [doi]

Abstract

Abstract is missing.