Simulation of Flooding Phenomenon in Packed Column using Electrical Capacitance Tomography - researchr publication authors

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Yuan Chen, Zhigang Li, Yunjie Yang, Jiabin Jia, Chang Liu, Mathieu Serge Lucquiaud. Simulation of Flooding Phenomenon in Packed Column using Electrical Capacitance Tomography. In 2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019, Abu Dhabi, United Arab Emirates, December 9-10, 2019. pages 1-5, IEEE, 2019. [doi]

This author has not been identified. Look up 'Yuan Chen' in GoogleThis author has not been identified. Look up 'Zhigang Li' in GoogleThis author has not been identified. Look up 'Yunjie Yang' in GoogleThis author has not been identified. Look up 'Jiabin Jia' in GoogleThis author has not been identified. Look up 'Chang Liu' in GoogleThis author has not been identified. Look up 'Mathieu Serge Lucquiaud' in Google

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