Yuan Chen, Zhigang Li, Yunjie Yang, Jiabin Jia, Chang Liu, Mathieu Serge Lucquiaud. Simulation of Flooding Phenomenon in Packed Column using Electrical Capacitance Tomography. In 2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019, Abu Dhabi, United Arab Emirates, December 9-10, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{ChenLYJLL19,
title = {Simulation of Flooding Phenomenon in Packed Column using Electrical Capacitance Tomography},
author = {Yuan Chen and Zhigang Li and Yunjie Yang and Jiabin Jia and Chang Liu and Mathieu Serge Lucquiaud},
year = {2019},
doi = {10.1109/IST48021.2019.9010204},
url = {https://doi.org/10.1109/IST48021.2019.9010204},
researchr = {https://researchr.org/publication/ChenLYJLL19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019, Abu Dhabi, United Arab Emirates, December 9-10, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3868-8},
}