Simulation of Flooding Phenomenon in Packed Column using Electrical Capacitance Tomography

Yuan Chen, Zhigang Li, Yunjie Yang, Jiabin Jia, Chang Liu, Mathieu Serge Lucquiaud. Simulation of Flooding Phenomenon in Packed Column using Electrical Capacitance Tomography. In 2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019, Abu Dhabi, United Arab Emirates, December 9-10, 2019. pages 1-5, IEEE, 2019. [doi]

Abstract

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