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Hardware Protection via Logic Locking Test Points

Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Justyna Zawada. Hardware Protection via Logic Locking Test Points. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(12):3020-3030, 2018. [doi]

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