Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam. A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{ChenMVKRA20,
title = {A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors},
author = {Yen-Pu Chen and Bikram Kishore Mahajan and Dhanoop Varghese and Srikanth Krishnan and Vijay Reddy and Muhammad Ashraful Alam},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128965},
url = {https://doi.org/10.1109/IRPS45951.2020.9128965},
researchr = {https://researchr.org/publication/ChenMVKRA20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}