Yibo Chen, Dimin Niu, Yuan Xie, Krishnendu Chakrabarty. Cost-effective integration of three-dimensional (3D) ICs emphasizing testing cost analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 471-476, IEEE, 2010. [doi]
@inproceedings{ChenNXC10,
title = {Cost-effective integration of three-dimensional (3D) ICs emphasizing testing cost analysis},
author = {Yibo Chen and Dimin Niu and Yuan Xie and Krishnendu Chakrabarty},
year = {2010},
doi = {10.1109/ICCAD.2010.5653753},
url = {http://dx.doi.org/10.1109/ICCAD.2010.5653753},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/ChenNXC10},
cites = {0},
citedby = {0},
pages = {471-476},
booktitle = {2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA},
publisher = {IEEE},
}