Yibo Chen, Dimin Niu, Yuan Xie, Krishnendu Chakrabarty. Cost-effective integration of three-dimensional (3D) ICs emphasizing testing cost analysis. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 471-476, IEEE, 2010. [doi]
Abstract is missing.