Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski. A test pattern ordering algorithm for diagnosis with truncated fail data. In Ellen Sentovich, editor, Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006. pages 399-404, ACM, 2006. [doi]
Abstract is missing.