An efficient approach to pseudo-exhaustive test generation for BIST design - researchr publication authors

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Chien-In H. Chen, Gerald E. Sobelman. An efficient approach to pseudo-exhaustive test generation for BIST design. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 576-579, IEEE, 1989. [doi]

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