Chien-In H. Chen, Gerald E. Sobelman. An efficient approach to pseudo-exhaustive test generation for BIST design. In Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989. pages 576-579, IEEE, 1989. [doi]
@inproceedings{ChenS89-3,
title = {An efficient approach to pseudo-exhaustive test generation for BIST design},
author = {Chien-In H. Chen and Gerald E. Sobelman},
year = {1989},
doi = {10.1109/ICCD.1989.63431},
url = {https://doi.org/10.1109/ICCD.1989.63431},
researchr = {https://researchr.org/publication/ChenS89-3},
cites = {0},
citedby = {0},
pages = {576-579},
booktitle = {Computer Design: VLSI in Computers and Processors, ICCD 1989. Proceedings., 1989 IEEE International Conference on, Cambridge, MA, USA, October 2-4, 1989},
publisher = {IEEE},
isbn = {0-8186-1971-6},
}