Tom Chen, Glen Sunada. An Ultra-Large Capacity Single-Chip Memory Architecture With Self-Testing and Self-Repairing. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992. pages 576-581, IEEE Computer Society, 1992.
@inproceedings{ChenS92:7,
title = {An Ultra-Large Capacity Single-Chip Memory Architecture With Self-Testing and Self-Repairing},
author = {Tom Chen and Glen Sunada},
year = {1992},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/ChenS92%3A7},
cites = {0},
citedby = {0},
pages = {576-581},
booktitle = {Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992},
publisher = {IEEE Computer Society},
isbn = {0-8186-3110-4},
}