Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya. Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 297-302, IEEE Computer Society, 2011. [doi]
Abstract is missing.