Yu-Guang Chen, Ying-Jing Tsai. Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.