Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates

Jone F. Chen, Jiang Tao, Peng Fang, Chenming Hu. Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates. J. Solid-State Circuits, 34(3):367-371, 1999. [doi]

Authors

Jone F. Chen

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Jiang Tao

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Peng Fang

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Chenming Hu

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