Jone F. Chen, Jiang Tao, Peng Fang, Chenming Hu. Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates. J. Solid-State Circuits, 34(3):367-371, 1999. [doi]
@article{ChenTFH99,
title = {Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates},
author = {Jone F. Chen and Jiang Tao and Peng Fang and Chenming Hu},
year = {1999},
doi = {10.1109/4.748188},
url = {https://doi.org/10.1109/4.748188},
researchr = {https://researchr.org/publication/ChenTFH99},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {34},
number = {3},
pages = {367-371},
}