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Fault-tolerant TSV by using scan-chain test TSV

Fu-Wei Chen, Hui-Ling Ting, TingTing Hwang. Fault-tolerant TSV by using scan-chain test TSV. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 658-663, IEEE, 2014. [doi]

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