A Novel Cache-Utilization-Based Dynamic Voltage-Frequency Scaling Mechanism for Reliability Enhancements

Yen-Hao Chen, Yi-Lun Tang, Yi-Yu Liu, Allen C.-H. Wu, TingTing Hwang. A Novel Cache-Utilization-Based Dynamic Voltage-Frequency Scaling Mechanism for Reliability Enhancements. IEEE Trans. VLSI Syst., 25(3):820-832, 2017. [doi]

Abstract

Abstract is missing.