Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications

Ying-Chen Chen, Xiaohan Wu, Yao-Feng Chang, Jack C. Lee. Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications. In 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018. pages 1-2, IEEE, 2018. [doi]

Authors

Ying-Chen Chen

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Xiaohan Wu

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Yao-Feng Chang

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Jack C. Lee

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