Ying-Chen Chen, Xiaohan Wu, Yao-Feng Chang, Jack C. Lee. Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications. In 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018. pages 1-2, IEEE, 2018. [doi]
@inproceedings{ChenWCL18-0,
title = {Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications},
author = {Ying-Chen Chen and Xiaohan Wu and Yao-Feng Chang and Jack C. Lee},
year = {2018},
doi = {10.1109/DRC.2018.8442232},
url = {https://doi.org/10.1109/DRC.2018.8442232},
researchr = {https://researchr.org/publication/ChenWCL18-0},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018},
publisher = {IEEE},
isbn = {978-1-5386-3028-0},
}