The AB-filling methodology for power-aware at-speed scan testing - researchr publication authors

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Tsung-Tang Chen, Po-Han Wu, Kung-Han Chen, Jiann-Chyi Rau, Shih-Ming Tzeng. The AB-filling methodology for power-aware at-speed scan testing. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 807, IEEE, 2010. [doi]

This author has not been identified. Look up 'Tsung-Tang Chen' in GoogleThis author has not been identified. Look up 'Po-Han Wu' in GoogleThis author has not been identified. Look up 'Kung-Han Chen' in GoogleThis author has not been identified. Look up 'Jiann-Chyi Rau' in GoogleThis author has not been identified. Look up 'Shih-Ming Tzeng' in Google

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