Tsung-Tang Chen, Po-Han Wu, Kung-Han Chen, Jiann-Chyi Rau, Shih-Ming Tzeng. The AB-filling methodology for power-aware at-speed scan testing. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 807, IEEE, 2010. [doi]
Abstract is missing.