Junting Chen, Chengcai Wang, Zuoheng Jiang, Mengyuan Hua. Processes of p-GaN Gate HEMTs for High-efficiency and High-reliability Applications. In 15th IEEE International Conference on ASIC, ASICON 2023, Nanjing, China, October 24-27, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.