Chih-Lieh Chen, Jim-Wei Wu, Yi-Ting Lin, Yu-Ting Lo, Li-Chen Fu. Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy. In Proceedings of the 52nd IEEE Conference on Decision and Control, CDC 2013, December 10-13, 2013, Firenze, Italy. pages 348-353, IEEE, 2013. [doi]
@inproceedings{ChenWLLF13,
title = {Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy},
author = {Chih-Lieh Chen and Jim-Wei Wu and Yi-Ting Lin and Yu-Ting Lo and Li-Chen Fu},
year = {2013},
doi = {10.1109/CDC.2013.6759906},
url = {http://dx.doi.org/10.1109/CDC.2013.6759906},
researchr = {https://researchr.org/publication/ChenWLLF13},
cites = {0},
citedby = {0},
pages = {348-353},
booktitle = {Proceedings of the 52nd IEEE Conference on Decision and Control, CDC 2013, December 10-13, 2013, Firenze, Italy},
publisher = {IEEE},
isbn = {978-1-4673-5714-2},
}