Yu-Guang Chen, Tao Wang, Kuan-Yu Lai, Wan-yu Wen, Yiyu Shi, Shih-Chieh Chang. Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]
@inproceedings{ChenWLWSC14, title = {Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs}, author = {Yu-Guang Chen and Tao Wang and Kuan-Yu Lai and Wan-yu Wen and Yiyu Shi and Shih-Chieh Chang}, year = {2014}, doi = {10.1145/2593069.2593115}, url = {http://doi.acm.org/10.1145/2593069.2593115}, researchr = {https://researchr.org/publication/ChenWLWSC14}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014}, publisher = {ACM}, isbn = {978-1-4503-2730-5}, }