Zhanping Chen, Liqiong Wei, Kaushik Roy. On effective I::DDQ:: testing of low-voltage CMOS circuits using leakage control techniques. IEEE Trans. VLSI Syst., 9(5):718-725, 2001. [doi]
@article{ChenWR01,
title = {On effective I::DDQ:: testing of low-voltage CMOS circuits using leakage control techniques},
author = {Zhanping Chen and Liqiong Wei and Kaushik Roy},
year = {2001},
doi = {10.1109/92.953504},
url = {http://doi.ieeecomputersociety.org/10.1109/92.953504},
tags = {testing},
researchr = {https://researchr.org/publication/ChenWR01},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {9},
number = {5},
pages = {718-725},
}