Meng-Chi Chen, Tsung-Hsuan Wu, Cheng-Wen Wu. A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 19-24, IEEE, 2018. [doi]
@inproceedings{ChenWW18-5,
title = {A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit},
author = {Meng-Chi Chen and Tsung-Hsuan Wu and Cheng-Wen Wu},
year = {2018},
doi = {10.1109/ATS.2018.00015},
url = {https://doi.org/10.1109/ATS.2018.00015},
researchr = {https://researchr.org/publication/ChenWW18-5},
cites = {0},
citedby = {0},
pages = {19-24},
booktitle = {27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018},
publisher = {IEEE},
isbn = {978-1-5386-9466-4},
}