Meng-Chi Chen, Tsung-Hsuan Wu, Cheng-Wen Wu. A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit. In 27th IEEE Asian Test Symposium, ATS 2018, Hefei, China, October 15-18, 2018. pages 19-24, IEEE, 2018. [doi]
Abstract is missing.