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PATCH: Process-Variation-Resilient Space Allocation for Open-Channel SSD with 3D Flash

Jing Chen, Yi Wang, Amelie Chi Zhou, Rui Mao, Tao Li. PATCH: Process-Variation-Resilient Space Allocation for Open-Channel SSD with 3D Flash. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 216-221, IEEE, 2019. [doi]

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Jing Chen

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Yi Wang

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Amelie Chi Zhou

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Rui Mao

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Tao Li

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