PATCH: Process-Variation-Resilient Space Allocation for Open-Channel SSD with 3D Flash

Jing Chen, Yi Wang, Amelie Chi Zhou, Rui Mao, Tao Li. PATCH: Process-Variation-Resilient Space Allocation for Open-Channel SSD with 3D Flash. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 216-221, IEEE, 2019. [doi]

Abstract

Abstract is missing.