Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Zhen Chen, Dong Xiang. A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(6):966-976, 2010. [doi]
Abstract is missing.