Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Zhen Chen, Tangbin Xia, Yanting Li, Ershun Pan. Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning. IEEE Transactions on Reliability, 69(3):887-902, 2020. [doi]

This author has not been identified. Look up 'Zhen Chen' in GoogleThis author has not been identified. Look up 'Tangbin Xia' in GoogleThis author has not been identified. Look up 'Yanting Li' in GoogleThis author has not been identified. Look up 'Ershun Pan' in Google

runs on WebDSL